Anomalous Small-Angle X-ray Scattering from Nickel-Neutralized Ionomers. 2. Semicrystalline Polymer Matrices

Stuart L. Cooper, Richard A. Register

Research output: Contribution to journalArticle

46 Scopus citations

Abstract

The ability of anomalous small-angle X-ray scattering (ASAXS) to determine the sign of the electron density difference between the crystalline and amorphous phases in a nickel-neutralized poly(ethylene-co-methacrylic acid) ionomer has been demonstrated. The only a priori knowledge required is which of the phases causing the reflection has a greater concentration of nickel. All observed features of the scattering patterns are consistent with the generally accepted three-phase model incorporating lamellar crystallites, interlamellar amorphous polymeric material, and ionic aggregates distributed within the amorphous lamellae. The change in the intensity of the low-g reflection was in reasonable agreement with that calculated from experimental values of for Ni metal. A nickel-neutralized Nafion perfluorosulfonate ionomer was also studied, but no ionomer peak was visible due to a fortuitous equality of ionic aggregate and amorphous polymer electron densities.

Original languageEnglish (US)
Pages (from-to)318-323
Number of pages6
JournalMacromolecules
Volume23
Issue number1
DOIs
StatePublished - Jan 1 1990

All Science Journal Classification (ASJC) codes

  • Organic Chemistry
  • Polymers and Plastics
  • Inorganic Chemistry
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Anomalous Small-Angle X-ray Scattering from Nickel-Neutralized Ionomers. 2. Semicrystalline Polymer Matrices'. Together they form a unique fingerprint.

  • Cite this