Anomalous Small-Angle X-ray Scattering from a Sulfonated Polystyrene Ionomer

Y. Samuel Ding, Stevan R. Hubbard, Keith O. Hodgson, Richard A. Register, Stuart L. Cooper

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114 Scopus citations

Abstract

Anomalous small-angle X-ray scattering has been employed to study the morphology of a nickel-neutralized sulfonated polystyrene ionomer, with particular emphasis on the characteristic upturn in scattered intensity near zero angle. The results indicate that the zero-order scattering is related to the ionomer's neutralizing cation. Applying the Debye-Bueche random two-phase model to the data indicates that the heterogeneity giving rise to the zero-angle scattering has a much larger length scale and smaller electron density difference than the aggregate-matrix scattering and may be due to an inhomogeneous distribution of isolated ionic groups in the matrix.

Original languageEnglish (US)
Pages (from-to)1698-1703
Number of pages6
JournalMacromolecules
Volume21
Issue number6
DOIs
StatePublished - Jan 1 1988
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Organic Chemistry
  • Polymers and Plastics
  • Inorganic Chemistry
  • Materials Chemistry

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    Samuel Ding, Y., Hubbard, S. R., Hodgson, K. O., Register, R. A., & Cooper, S. L. (1988). Anomalous Small-Angle X-ray Scattering from a Sulfonated Polystyrene Ionomer. Macromolecules, 21(6), 1698-1703. https://doi.org/10.1021/ma00184a028