The authors report low-temperature resistance measurements in a modulation-doped, (311) A GaAs two-dimensional hole system as a function of applied in-plane strain. The data reveal a strong but anisotropic piezoresistance whose magnitude depends on the density as well as the direction along which the resistance is measured. At a density of 1.6× 1011 cm-2 and for a strain of about 2× 10-4 applied along the [01 1-], e.g., the resistance measured along this direction changes by nearly a factor of 2, while the resistance change in the [2- 33] direction is less than 10% and has the opposite sign. The accurate energy band calculations indicate a pronounced and anisotropic deformation of the heavy-hole dispersion with strain, qualitatively consistent with the experimental data. The extremely anisotropic magnitude of the piezoresistance, however, lacks a quantitative explanation.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - 2007|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)