Abstract
The surface morphology of high mobility heterostructures was examined. It was found that the heterostructures show line formation with varying degrees of severity over the full complement of wafers tested. These surface properties were correlated to transport results.
| Original language | English (US) |
|---|---|
| Article number | 126803 |
| Pages (from-to) | 126803/1-126803/4 |
| Journal | Physical review letters |
| Volume | 87 |
| Issue number | 12 |
| State | Published - Sep 17 2001 |
| Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy
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