We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ0 /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - Sep 6 2010|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)