Analytical technique for subwavelength far field imaging

S. Thongrattanasiri; N. A. Kuhta; M. D. Escarra; A. J. Hoffman; Claire F. Gmachl; V. A. Podolskiy

doi:10.1063/1.3487779

Analytical technique for subwavelength far field imaging

S. Thongrattanasiri, N. A. Kuhta, M. D. Escarra, A. J. Hoffman, Claire F. Gmachl, V. A. Podolskiy

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ₀ /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.

Original language	English (US)
Article number	101103
Journal	Applied Physics Letters
Volume	97
Issue number	10
DOIs	https://doi.org/10.1063/1.3487779
State	Published - Sep 6 2010

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3487779

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title = "Analytical technique for subwavelength far field imaging",

abstract = "We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ0 /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.",

author = "S. Thongrattanasiri and Kuhta, {N. A.} and Escarra, {M. D.} and Hoffman, {A. J.} and Gmachl, {Claire F.} and Podolskiy, {V. A.}",

note = "Funding Information: This work has been partially supported by ONR (Grant No. N00014-07-1-0457), NSF (Grant No. ECCS-0724763), and AFOSR (Grant No. FA9550-09-1-0029). Copyright: Copyright 2010 Elsevier B.V., All rights reserved.",

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doi = "10.1063/1.3487779",

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T1 - Analytical technique for subwavelength far field imaging

AU - Thongrattanasiri, S.

AU - Kuhta, N. A.

AU - Escarra, M. D.

AU - Hoffman, A. J.

AU - Gmachl, Claire F.

AU - Podolskiy, V. A.

N1 - Funding Information: This work has been partially supported by ONR (Grant No. N00014-07-1-0457), NSF (Grant No. ECCS-0724763), and AFOSR (Grant No. FA9550-09-1-0029). Copyright: Copyright 2010 Elsevier B.V., All rights reserved.

PY - 2010/9/6

Y1 - 2010/9/6

N2 - We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ0 /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.

AB - We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ0 /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.

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Analytical technique for subwavelength far field imaging

Abstract

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