Analytical technique for subwavelength far field imaging

S. Thongrattanasiri, N. A. Kuhta, M. D. Escarra, A. J. Hoffman, Claire F. Gmachl, V. A. Podolskiy

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We develop an analytical technique for retrieving the size and shape of subwavelength objects using far-field measurements. The approach relies on subwavelength diffraction gratings scattering evanescent information into the far field along with a numerical algorithm that is capable of deconvoluting this information based on the far-field intensity measurements. Several examples are presented, demonstrating resolution on the order of λ0 /20. The developed method can be used at any frequency range, and may become a practical alternative to scanning near-field microscopy.

Original languageEnglish (US)
Article number101103
JournalApplied Physics Letters
Issue number10
StatePublished - Sep 6 2010

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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    Thongrattanasiri, S., Kuhta, N. A., Escarra, M. D., Hoffman, A. J., Gmachl, C. F., & Podolskiy, V. A. (2010). Analytical technique for subwavelength far field imaging. Applied Physics Letters, 97(10), [101103].