Abstract
We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.
Original language | English (US) |
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Title of host publication | Quantum Electronics and Laser Science Conference, QELS 2010 |
State | Published - Dec 1 2010 |
Event | Quantum Electronics and Laser Science Conference, QELS 2010 - San Jose, CA, United States Duration: May 16 2010 → May 21 2010 |
Other
Other | Quantum Electronics and Laser Science Conference, QELS 2010 |
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Country/Territory | United States |
City | San Jose, CA |
Period | 5/16/10 → 5/21/10 |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Atomic and Molecular Physics, and Optics