Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri, Anthony J. Hoffman, Matthew Escarra, Claire F. Gmachl, Viktor A. Podolskiy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

Original languageEnglish (US)
Title of host publicationQuantum Electronics and Laser Science Conference, QELS 2010
StatePublished - Dec 1 2010
EventQuantum Electronics and Laser Science Conference, QELS 2010 - San Jose, CA, United States
Duration: May 16 2010May 21 2010

Other

OtherQuantum Electronics and Laser Science Conference, QELS 2010
CountryUnited States
CitySan Jose, CA
Period5/16/105/21/10

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Thongrattanasiri, S., Hoffman, A. J., Escarra, M., Gmachl, C. F., & Podolskiy, V. A. (2010). Analytical technique for determining the size of subwavelength focal spots in far field. In Quantum Electronics and Laser Science Conference, QELS 2010