Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri; Anthony J. Hoffman; Matthew Escarra; Claire F. Gmachl; Viktor A. Podolskiy

Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri, Anthony J. Hoffman, Matthew Escarra, Claire F. Gmachl, Viktor A. Podolskiy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

Original language	English (US)
Title of host publication	Quantum Electronics and Laser Science Conference, QELS 2010
State	Published - Dec 1 2010
Event	Quantum Electronics and Laser Science Conference, QELS 2010 - San Jose, CA, United States Duration: May 16 2010 → May 21 2010

Other

Other	Quantum Electronics and Laser Science Conference, QELS 2010
Country/Territory	United States
City	San Jose, CA
Period	5/16/10 → 5/21/10

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

@inproceedings{35553cedfd994b7184e2c51bfb249a47,

title = "Analytical technique for determining the size of subwavelength focal spots in far field",

abstract = "We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.",

author = "Sukosin Thongrattanasiri and Hoffman, {Anthony J.} and Matthew Escarra and Gmachl, {Claire F.} and Podolskiy, {Viktor A.}",

year = "2010",

month = dec,

day = "1",

language = "English (US)",

isbn = "9781557528896",

booktitle = "Quantum Electronics and Laser Science Conference, QELS 2010",

note = "Quantum Electronics and Laser Science Conference, QELS 2010 ; Conference date: 16-05-2010 Through 21-05-2010",

}

TY - GEN

T1 - Analytical technique for determining the size of subwavelength focal spots in far field

AU - Thongrattanasiri, Sukosin

AU - Hoffman, Anthony J.

AU - Escarra, Matthew

AU - Gmachl, Claire F.

AU - Podolskiy, Viktor A.

PY - 2010/12/1

Y1 - 2010/12/1

N2 - We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

AB - We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

UR - http://www.scopus.com/inward/record.url?scp=84897699668&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897699668&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84897699668

SN - 9781557528896

BT - Quantum Electronics and Laser Science Conference, QELS 2010

T2 - Quantum Electronics and Laser Science Conference, QELS 2010

Y2 - 16 May 2010 through 21 May 2010

ER -

Analytical technique for determining the size of subwavelength focal spots in far field

Abstract

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All Science Journal Classification (ASJC) codes

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