Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri; Anthony J. Hoffman; Matthew Escarra; Claire F. Gmachl; Viktor A. Podolskiy

doi:10.1364/qels.2010.qwb5

Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri, Anthony J. Hoffman, Matthew Escarra, Claire F. Gmachl, Viktor A. Podolskiy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

Original language	English (US)
Title of host publication	Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Subtitle of host publication	2010 Laser Science to Photonic Applications, CLEO/QELS 2010
Publisher	Association for Computing Machinery
ISBN (Print)	9781557528902
DOIs	https://doi.org/10.1364/qels.2010.qwb5
State	Published - 2010

Publication series

Name	Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Radiation

Access to Document

10.1364/qels.2010.qwb5

Cite this

Thongrattanasiri, S., Hoffman, A. J., Escarra, M., Gmachl, C. F., & Podolskiy, V. A. (2010). Analytical technique for determining the size of subwavelength focal spots in far field. In Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010 Article 5500803 (Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010). Association for Computing Machinery. https://doi.org/10.1364/qels.2010.qwb5

Thongrattanasiri, Sukosin ; Hoffman, Anthony J. ; Escarra, Matthew et al. / Analytical technique for determining the size of subwavelength focal spots in far field. Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. Association for Computing Machinery, 2010. (Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010).

@inproceedings{b577069de7fe4f2aa4690bd1ec6096fa,

title = "Analytical technique for determining the size of subwavelength focal spots in far field",

abstract = "We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.",

author = "Sukosin Thongrattanasiri and Hoffman, {Anthony J.} and Matthew Escarra and Gmachl, {Claire F.} and Podolskiy, {Viktor A.}",

year = "2010",

doi = "10.1364/qels.2010.qwb5",

language = "English (US)",

isbn = "9781557528902",

series = "Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010",

publisher = "Association for Computing Machinery",

booktitle = "Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference",

}

Thongrattanasiri, S, Hoffman, AJ, Escarra, M, Gmachl, CF & Podolskiy, VA 2010, Analytical technique for determining the size of subwavelength focal spots in far field. in Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010., 5500803, Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010, Association for Computing Machinery. https://doi.org/10.1364/qels.2010.qwb5

Analytical technique for determining the size of subwavelength focal spots in far field. / Thongrattanasiri, Sukosin; Hoffman, Anthony J.; Escarra, Matthew et al.
Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. Association for Computing Machinery, 2010. 5500803 (Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Analytical technique for determining the size of subwavelength focal spots in far field

AU - Thongrattanasiri, Sukosin

AU - Hoffman, Anthony J.

AU - Escarra, Matthew

AU - Gmachl, Claire F.

AU - Podolskiy, Viktor A.

PY - 2010

Y1 - 2010

N2 - We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

AB - We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

UR - http://www.scopus.com/inward/record.url?scp=77957551215&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77957551215&partnerID=8YFLogxK

U2 - 10.1364/qels.2010.qwb5

DO - 10.1364/qels.2010.qwb5

M3 - Conference contribution

AN - SCOPUS:77957551215

SN - 9781557528902

T3 - Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

BT - Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference

PB - Association for Computing Machinery

ER -

Thongrattanasiri S, Hoffman AJ, Escarra M, Gmachl CF, Podolskiy VA. Analytical technique for determining the size of subwavelength focal spots in far field. In Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010. Association for Computing Machinery. 2010. 5500803. (Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010). doi: 10.1364/qels.2010.qwb5

Analytical technique for determining the size of subwavelength focal spots in far field

Abstract

Publication series

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this