Analytical technique for determining the size of subwavelength focal spots in far field

Sukosin Thongrattanasiri, Anthony J. Hoffman, Matthew Escarra, Claire F. Gmachl, Viktor A. Podolskiy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We develop a technique for determining the size of subwavelength focal spots without near-field microscopy, based on carefully designed gratings that convert the subwavelength information into propagating waves, far-field measurements, and computer post-processing.

Original languageEnglish (US)
Title of host publicationLasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Subtitle of host publication2010 Laser Science to Photonic Applications, CLEO/QELS 2010
PublisherAssociation for Computing Machinery
ISBN (Print)9781557528902
DOIs
StatePublished - 2010

Publication series

NameLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation

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