Analysis of reflectometry density profile measurements in JET

A. C.C. Sips, G. J. Kramer

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

A multichannel microwave reflectometer system is used to measure the electron density profile at JET. A new measurement technique is described which gives continuous information on the electron profile in time. Profile measurements using swept-frequency measurements are combined with accurate measurements of the evolution of the density using fixed-frequency operation. The analysis of the data can be carried out routinely for each discharge at JET. The method includes estimates for the uncertainties on the measurements, corrections for finite sweep on the data and relativistic effects. The results compare well with other measurements of the electron density in JET.

Original languageEnglish (US)
Article number008
Pages (from-to)743-755
Number of pages13
JournalPlasma Physics and Controlled Fusion
Volume35
Issue number6
DOIs
StatePublished - 1993
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear Energy and Engineering
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Analysis of reflectometry density profile measurements in JET'. Together they form a unique fingerprint.

Cite this