ANALYSIS OF LOW-ENERGY ELECTRON DIFFRACTION INTENSITIES FROM ZnS(110).

C. B. Duke, R. J. Meyer, A. Paton, Antoine Kahn, J. Carelli, J. L. Yeh

Research output: Contribution to journalConference article

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Abstract

Preliminary results for the atomic geometry of the (110) surface of ZnS are reported. The surface structure is determined by comparing dynamical calculations of elastic low-energy electron diffraction (ELEED) intensities with those measured at T equals 300 K using a pulsed floodgun technique to suppress the charging of the insulating ZnS sample. In contrast to other tetrahedrally-coordinated, zincblende-structure compound semiconductors for which the (110) surfaces are known to be reconstructed, i. e. , GaAs, InSb, InP, and ZnTe, the measured ELEED intensities from ZnS(110) are described by calculations based on the truncated bulk atomic geometry and minor variants.

Original languageEnglish (US)
Pages (from-to)866-870
Number of pages5
JournalJournal of vacuum science & technology
Volume18
Issue number3
DOIs
StatePublished - Jan 1 1980
EventProc of the Natl Symp of the Am Vac Soc, 27th, Pt 2 - Detroit, MI, Engl
Duration: Oct 13 1980Oct 17 1980

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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