An investigation of Au-Ag interface formed by cold welding using focused ion beam/transmission electron microscopy

Yifang Cao, Nan Yao, Kevin McIlwrath, Jikou Zhou, Gabriel Osinkolu, Winston O. Soboyejo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper reports the recent results of a transmission electron microscopy study of cold-welded and e-beam deposited Au-Ag interfaces. Dust particles were observed to be embedded between the cold-welded interfaces. These are shown to amplify the defect regions caused by surface asperities. Electron energy loss spectroscopy (EELS) analysis revealed that there was no significant diffusion zone across the cold welding interface. However, sub-micron mechanical twining structures were revealed by transmission electron microscopy (TEM) analyses. These were found to penetrate through both the cold-welded and control Au-Ag interfaces, but with different orientations.

Original languageEnglish (US)
Title of host publicationOrganic Electronics
Subtitle of host publicationMaterials, Devices and Applications
PublisherMaterials Research Society
Pages13-18
Number of pages6
ISBN (Print)9781604234176
DOIs
StatePublished - 2006
Event2006 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 27 2006Dec 1 2006

Publication series

NameMaterials Research Society Symposium Proceedings
Volume965
ISSN (Print)0272-9172

Other

Other2006 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA
Period11/27/0612/1/06

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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