Amorphous silicon thin-film transistor backplanes deposited at 200 °C on clear plastic for lamination to electrophoretic displays
- Alex Z. Kattamis
- , I. Chun Cheng
- , Ke Long
- , Bahman Hekmatshoar
- , Kunigunde H. Cherenack
- , Sigurd Wagner
- , James C. Sturm
- , Sameer M. Venugopal
- , Douglas E. Loy
- , Shawn M. O'Rourke
- , David R. Allee
Research output: Contribution to journal › Article › peer-review
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