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Dive into the research topics of 'Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme'. Together they form a unique fingerprint.- Sort by
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Bahman Hekmatshoar, Kunigunde Cherenack, Ke Long, Alex Kattamis, Sigurd Wagner, James C. Sturm
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution