TY - GEN
T1 - Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme
AU - Hekmatshoar, Bahman
AU - Cherenack, Kunigunde
AU - Long, Ke
AU - Kattamis, Alex
AU - Wagner, Sigurd
AU - Sturm, James Christopher
PY - 2008/12/1
Y1 - 2008/12/1
UR - http://www.scopus.com/inward/record.url?scp=64849096654&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=64849096654&partnerID=8YFLogxK
U2 - 10.1109/DRC.2008.4800822
DO - 10.1109/DRC.2008.4800822
M3 - Conference contribution
AN - SCOPUS:64849096654
SN - 9781424419425
T3 - Device Research Conference - Conference Digest, DRC
SP - 243
EP - 244
BT - 66th DRC Device Research Conference Digest, DRC 2008
T2 - 66th DRC Device Research Conference Digest, DRC 2008
Y2 - 23 June 2008 through 25 June 2008
ER -