Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme

Bahman Hekmatshoar; Kunigunde Cherenack; Ke Long; Alex Kattamis; Sigurd Wagner; James C. Sturm

doi:10.1109/DRC.2008.4800822

Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme

Bahman Hekmatshoar, Kunigunde Cherenack, Ke Long, Alex Kattamis, Sigurd Wagner, James C. Sturm

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	66th DRC Device Research Conference Digest, DRC 2008
Pages	243-244
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2008.4800822
State	Published - 2008
Event	66th DRC Device Research Conference Digest, DRC 2008 - Santa Barbara, CA, United States Duration: Jun 23 2008 → Jun 25 2008

Publication series

Name	Device Research Conference - Conference Digest, DRC
ISSN (Print)	1548-3770

Other

Other	66th DRC Device Research Conference Digest, DRC 2008
Country/Territory	United States
City	Santa Barbara, CA
Period	6/23/08 → 6/25/08

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/DRC.2008.4800822

Cite this

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title = "Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme",

author = "Bahman Hekmatshoar and Kunigunde Cherenack and Ke Long and Alex Kattamis and Sigurd Wagner and Sturm, {James C.}",

year = "2008",

doi = "10.1109/DRC.2008.4800822",

language = "English (US)",

isbn = "9781424419425",

series = "Device Research Conference - Conference Digest, DRC",

pages = "243--244",

booktitle = "66th DRC Device Research Conference Digest, DRC 2008",

note = "66th DRC Device Research Conference Digest, DRC 2008 ; Conference date: 23-06-2008 Through 25-06-2008",

}

Hekmatshoar, B, Cherenack, K, Long, K, Kattamis, A, Wagner, S & Sturm, JC 2008, Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme. in 66th DRC Device Research Conference Digest, DRC 2008., 4800822, Device Research Conference - Conference Digest, DRC, pp. 243-244, 66th DRC Device Research Conference Digest, DRC 2008, Santa Barbara, CA, United States, 6/23/08. https://doi.org/10.1109/DRC.2008.4800822

Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme. / Hekmatshoar, Bahman; Cherenack, Kunigunde; Long, Ke; Kattamis, Alex; Wagner, Sigurd; Sturm, James C.

66th DRC Device Research Conference Digest, DRC 2008. 2008. p. 243-244 4800822 (Device Research Conference - Conference Digest, DRC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme

AU - Hekmatshoar, Bahman

AU - Cherenack, Kunigunde

AU - Long, Ke

AU - Kattamis, Alex

AU - Wagner, Sigurd

AU - Sturm, James C.

PY - 2008

Y1 - 2008

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U2 - 10.1109/DRC.2008.4800822

DO - 10.1109/DRC.2008.4800822

M3 - Conference contribution

AN - SCOPUS:64849096654

SN - 9781424419425

T3 - Device Research Conference - Conference Digest, DRC

SP - 243

EP - 244

BT - 66th DRC Device Research Conference Digest, DRC 2008

T2 - 66th DRC Device Research Conference Digest, DRC 2008

Y2 - 23 June 2008 through 25 June 2008

ER -

Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme

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All Science Journal Classification (ASJC) codes

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