Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme

Bahman Hekmatshoar, Kunigunde Cherenack, Ke Long, Alex Kattamis, Sigurd Wagner, James Christopher Sturm

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publication66th DRC Device Research Conference Digest, DRC 2008
Pages243-244
Number of pages2
DOIs
StatePublished - Dec 1 2008
Event66th DRC Device Research Conference Digest, DRC 2008 - Santa Barbara, CA, United States
Duration: Jun 23 2008Jun 25 2008

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other66th DRC Device Research Conference Digest, DRC 2008
CountryUnited States
CitySanta Barbara, CA
Period6/23/086/25/08

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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  • Cite this

    Hekmatshoar, B., Cherenack, K., Long, K., Kattamis, A., Wagner, S., & Sturm, J. C. (2008). Amoled reliability with a-si tft's in normal vs. inverted TFT/OLED integration scheme. In 66th DRC Device Research Conference Digest, DRC 2008 (pp. 243-244). [4800822] (Device Research Conference - Conference Digest, DRC). https://doi.org/10.1109/DRC.2008.4800822