AlN films on GaN: Sources of error in the photoemission measurement of electron affinity

V. M. Bermudez, C. I. Wu, Antoine Kahn

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Fingerprint

Dive into the research topics of 'AlN films on GaN: Sources of error in the photoemission measurement of electron affinity'. Together they form a unique fingerprint.

Keyphrases

Earth and Planetary Sciences