TY - GEN
T1 - Advances in laser assisted microwave plasma spectroscopy (LAMPS)
AU - Efthimion, Philip C.
PY - 2012
Y1 - 2012
N2 - LAMPS, Laser Assisted Microwave Spectroscopy, is a plasma spectroscopictechnique that has higher sensitivity to LIBS using little or no laser energy. The higher sensitivity is due to microwave energy extending the duration of themicro plasma for analyzing material. The sensitivity is enhanced a factor of 10 atwavelengths < 300 nm and 40-200 for wavelengths > 300 nm. The lower laserenergy results in no surface damage. The technique can be used to determine thecomposition of materials and detect biological and explosive agents. Recently, thedevice has been miniaturize to develop a portable hand held instrument.
AB - LAMPS, Laser Assisted Microwave Spectroscopy, is a plasma spectroscopictechnique that has higher sensitivity to LIBS using little or no laser energy. The higher sensitivity is due to microwave energy extending the duration of themicro plasma for analyzing material. The sensitivity is enhanced a factor of 10 atwavelengths < 300 nm and 40-200 for wavelengths > 300 nm. The lower laserenergy results in no surface damage. The technique can be used to determine thecomposition of materials and detect biological and explosive agents. Recently, thedevice has been miniaturize to develop a portable hand held instrument.
UR - https://www.scopus.com/pages/publications/84890476898
UR - https://www.scopus.com/pages/publications/84890476898#tab=citedBy
U2 - 10.1364/aio.2012.atu1a.2
DO - 10.1364/aio.2012.atu1a.2
M3 - Conference contribution
AN - SCOPUS:84890476898
SN - 1557529477
SN - 9781557529473
T3 - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012
SP - ATu1A.2
BT - Applied Industrial Optics
PB - Optical Society of America (OSA)
T2 - Applied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2012
Y2 - 24 June 2012 through 28 June 2012
ER -