Accurate leakage/delay estimation for FinFET standard cells under PVT variations using the response surface methodology

Sourindra M. Chaudhuri, Prateek Mishra, Niraj K. Jha

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Accurate leakage/delay estimation for FinFET standard cells under PVT variations using the response surface methodology'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science