Abstract
A novel wavelength detector with a large spectral response range has been realized by monolithically integrating two metal-semiconductor-metal photodetectors that have finger spacings less than the wavelength of the incident light. The operating principle of the detector is based on the one-to- one correspondence between the photocurrent ratio of the photodetectors and the wavelength of the incident light, caused by the resonance effect of the photodetectors' subwavelength-spaced fingers. The experiment shows that the device has a wavelength resolution of 5 nm in the spectral range of 450-800 nm.
Original language | English (US) |
---|---|
Pages (from-to) | 61-67 |
Number of pages | 7 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3006 |
DOIs | |
State | Published - 1997 |
Externally published | Yes |
Event | Optoelectronic Integrated Circuits - San Jose, CA, United States Duration: Feb 12 1997 → Feb 12 1997 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- Automatic wavelength calibration
- Metal-semiconductor- metal photodetectors
- Wavelength detector