### Abstract

Bose has developed a parallel unordered coding scheme using only r checkbits for 2^{r} information bits. This code can detect all unidirectional errors and requires simple parallel encoding/decoding. The information symbols can be separated from the check symbols. However, the information symbols containing all-0's and all-1's need to be transformed to two other information symbols. This allows one to reduce the number of checkbits over Berger code by 1. Since information symbols containing a power-of-two number of bits are quite common, this coding scheme should become quite popular. In this paper, a modular, economical and easily testable totally self-checking (TSC) checker design for the above code is described. The TSC concept is well-known for providing concurrent error detection of transient as well as permanent faults. The design is self-testing with at most only 2r+16 codeword tests. This means that if k is the number of information bits, the size of the codeword test is only O(log_{2}k). This is the first known TSC checker design for this code.

Original language | English (US) |
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Title of host publication | Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992 |

Publisher | IEEE Computer Society |

Pages | 165-170 |

Number of pages | 6 |

ISBN (Electronic) | 0780306236 |

DOIs | |

State | Published - Jan 1 1992 |

Event | 1992 IEEE VLSI Test Symposium, VLSI 1992 - Atlantic City, United States Duration: Apr 7 1992 → Apr 9 1992 |

### Publication series

Name | Proceedings of the IEEE VLSI Test Symposium |
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Volume | 1992-April |

### Conference

Conference | 1992 IEEE VLSI Test Symposium, VLSI 1992 |
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Country | United States |

City | Atlantic City |

Period | 4/7/92 → 4/9/92 |

### All Science Journal Classification (ASJC) codes

- Computer Science Applications
- Electrical and Electronic Engineering

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## Cite this

*Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992*(pp. 165-170). [232743] (Proceedings of the IEEE VLSI Test Symposium; Vol. 1992-April). IEEE Computer Society. https://doi.org/10.1109/VTEST.1992.232743