@inproceedings{93813475a4f34f9b806caf9bfa8468dd,
title = "A synthesis-based test generation and compaction algorithm for multifaults",
abstract = "Several synthesis strategies are presented for the synthesis of flattenable and non-flattenable circuits for complete multifault testability, with associated compaction procedures. Experimental results are provided which indicate that a compacted multifault test set derived using these strategies can be significantly smaller than the test set derived using previously proposed procedures. These results also indicate the substantially wider applicability of these procedures, as compared to previous techniques.",
author = "Srinivas Devadas and Kurt Keutzer and Sharad Malik",
year = "1991",
doi = "10.1145/127601.127694",
language = "English (US)",
isbn = "0818691492",
series = "Proceedings - Design Automation Conference",
publisher = "Publ by IEEE",
pages = "359--365",
booktitle = "Proceedings - Design Automation Conference",
note = "Proceedings of the 28th ACM/IEEE Design Automation Conference ; Conference date: 17-06-1991 Through 21-06-1991",
}