A Spatial Point Process-based Approach for Dropout Events Modeling in High-Temperature Superconductor Manufacturing

Mai Li, Shenglin Peng, Ying Lin, Qianmei Feng, Wenjiang Fu, Eduard Galstyan, Siwei Chen, Rohit Jain

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Recently, high-temperature superconductor (HTS) tapes have shown promising properties of high critical current, which are prerequisites for applications in high-field magnets. However, due to the unstable growth conditions in the HTS manufacturing process, dropout events, which refer to the significant drops of critical current at certain locations of HTS tapes, occur frequently resulting in the non-uniform performance of produced tapes. To produce HTS tapes with large scale, high yield and uniform performance, it is important to develop novel data analytic approaches focusing on modeling the dropout events and their associated process parameters. In this study, we develop a spatial point process-based framework that integrates the Granger causality-based feature selection, principle component analysis-based data fusion, and dropout events modeling based on a nonhomogeneous Poisson process. The proposed method is applied and evaluated on real data from HTS tapes, and the important process parameters associated with dropout occurrences are identified, e.g., substrate temperatures.

Original languageEnglish (US)
Title of host publicationIISE Annual Conference and Expo 2022
EditorsK. Ellis, W. Ferrell, J. Knapp
PublisherInstitute of Industrial and Systems Engineers, IISE
ISBN (Electronic)9781713858072
StatePublished - 2022
Externally publishedYes
EventIISE Annual Conference and Expo 2022 - Seattle, United States
Duration: May 21 2022May 24 2022

Publication series

NameIISE Annual Conference and Expo 2022

Conference

ConferenceIISE Annual Conference and Expo 2022
Country/TerritoryUnited States
CitySeattle
Period5/21/225/24/22

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Keywords

  • Dropout events in critical current
  • Granger causality test
  • Principal component analysis
  • Spatial point process
  • Superconductor manufacturing

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