TY - GEN
T1 - A Spatial Point Process-based Approach for Dropout Events Modeling in High-Temperature Superconductor Manufacturing
AU - Li, Mai
AU - Peng, Shenglin
AU - Lin, Ying
AU - Feng, Qianmei
AU - Fu, Wenjiang
AU - Galstyan, Eduard
AU - Chen, Siwei
AU - Jain, Rohit
N1 - Publisher Copyright:
© 2022 IISE Annual Conference and Expo 2022. All rights reserved.
PY - 2022
Y1 - 2022
N2 - Recently, high-temperature superconductor (HTS) tapes have shown promising properties of high critical current, which are prerequisites for applications in high-field magnets. However, due to the unstable growth conditions in the HTS manufacturing process, dropout events, which refer to the significant drops of critical current at certain locations of HTS tapes, occur frequently resulting in the non-uniform performance of produced tapes. To produce HTS tapes with large scale, high yield and uniform performance, it is important to develop novel data analytic approaches focusing on modeling the dropout events and their associated process parameters. In this study, we develop a spatial point process-based framework that integrates the Granger causality-based feature selection, principle component analysis-based data fusion, and dropout events modeling based on a nonhomogeneous Poisson process. The proposed method is applied and evaluated on real data from HTS tapes, and the important process parameters associated with dropout occurrences are identified, e.g., substrate temperatures.
AB - Recently, high-temperature superconductor (HTS) tapes have shown promising properties of high critical current, which are prerequisites for applications in high-field magnets. However, due to the unstable growth conditions in the HTS manufacturing process, dropout events, which refer to the significant drops of critical current at certain locations of HTS tapes, occur frequently resulting in the non-uniform performance of produced tapes. To produce HTS tapes with large scale, high yield and uniform performance, it is important to develop novel data analytic approaches focusing on modeling the dropout events and their associated process parameters. In this study, we develop a spatial point process-based framework that integrates the Granger causality-based feature selection, principle component analysis-based data fusion, and dropout events modeling based on a nonhomogeneous Poisson process. The proposed method is applied and evaluated on real data from HTS tapes, and the important process parameters associated with dropout occurrences are identified, e.g., substrate temperatures.
KW - Dropout events in critical current
KW - Granger causality test
KW - Principal component analysis
KW - Spatial point process
KW - Superconductor manufacturing
UR - https://www.scopus.com/pages/publications/85137173819
UR - https://www.scopus.com/inward/citedby.url?scp=85137173819&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:85137173819
T3 - IISE Annual Conference and Expo 2022
BT - IISE Annual Conference and Expo 2022
A2 - Ellis, K.
A2 - Ferrell, W.
A2 - Knapp, J.
PB - Institute of Industrial and Systems Engineers, IISE
T2 - IISE Annual Conference and Expo 2022
Y2 - 21 May 2022 through 24 May 2022
ER -