A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

T. Warwick; K. Franck; J. B. Kortright; G. Meigs; M. Moronne; S. Myneni; E. Rotenberg; S. Seal; W. F. Steele; H. Ade; A. Garcia; S. Cerasari; J. Denlinger; S. Hayakawa; A. P. Hitchcock; T. Tyliszczak; J. Kikuma; E. G. Rightor; H. J. Shin; B. P. Tonner

doi:10.1063/1.1149041

A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

T. Warwick
, K. Franck
, J. B. Kortright
, G. Meigs
, M. Moronne
, S. Myneni
, E. Rotenberg
, S. Seal
, W. F. Steele
, H. Ade
, A. Garcia
, S. Cerasari
, J. Denlinger
, S. Hayakawa
, A. P. Hitchcock
, T. Tyliszczak
, J. Kikuma
, E. G. Rightor
, H. J. Shin
, B. P. Tonner

Research output: Contribution to journal › Article › peer-review

99 Scopus citations

Abstract

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

Original language	English (US)
Pages (from-to)	2964-2973
Number of pages	10
Journal	Review of Scientific Instruments
Volume	69
Issue number	8
DOIs	https://doi.org/10.1063/1.1149041
State	Published - 1998
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.1149041

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Warwick, T., Franck, K., Kortright, J. B., Meigs, G., Moronne, M., Myneni, S., Rotenberg, E., Seal, S., Steele, W. F., Ade, H., Garcia, A., Cerasari, S., Denlinger, J., Hayakawa, S., Hitchcock, A. P., Tyliszczak, T., Kikuma, J., Rightor, E. G., Shin, H. J., & Tonner, B. P. (1998). A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source. Review of Scientific Instruments, 69(8), 2964-2973. https://doi.org/10.1063/1.1149041

@article{99c90d64e4d04f8c9fa7cd31edcde6c3,

title = "A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source",

abstract = "Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.",

author = "T. Warwick and K. Franck and Kortright, \{J. B.\} and G. Meigs and M. Moronne and S. Myneni and E. Rotenberg and S. Seal and Steele, \{W. F.\} and H. Ade and A. Garcia and S. Cerasari and J. Denlinger and S. Hayakawa and Hitchcock, \{A. P.\} and T. Tyliszczak and J. Kikuma and Rightor, \{E. G.\} and Shin, \{H. J.\} and Tonner, \{B. P.\}",

year = "1998",

doi = "10.1063/1.1149041",

language = "English (US)",

volume = "69",

pages = "2964--2973",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "8",

}

Warwick, T, Franck, K, Kortright, JB, Meigs, G, Moronne, M, Myneni, S, Rotenberg, E, Seal, S, Steele, WF, Ade, H, Garcia, A, Cerasari, S, Denlinger, J, Hayakawa, S, Hitchcock, AP, Tyliszczak, T, Kikuma, J, Rightor, EG, Shin, HJ & Tonner, BP 1998, 'A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source', Review of Scientific Instruments, vol. 69, no. 8, pp. 2964-2973. https://doi.org/10.1063/1.1149041

TY - JOUR

T1 - A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

AU - Warwick, T.

AU - Franck, K.

AU - Kortright, J. B.

AU - Meigs, G.

AU - Moronne, M.

AU - Myneni, S.

AU - Rotenberg, E.

AU - Seal, S.

AU - Steele, W. F.

AU - Ade, H.

AU - Garcia, A.

AU - Cerasari, S.

AU - Denlinger, J.

AU - Hayakawa, S.

AU - Hitchcock, A. P.

AU - Tyliszczak, T.

AU - Kikuma, J.

AU - Rightor, E. G.

AU - Shin, H. J.

AU - Tonner, B. P.

PY - 1998

Y1 - 1998

N2 - Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

AB - Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

UR - https://www.scopus.com/pages/publications/0032132429

UR - https://www.scopus.com/pages/publications/0032132429#tab=citedBy

U2 - 10.1063/1.1149041

DO - 10.1063/1.1149041

M3 - Article

AN - SCOPUS:0032132429

SN - 0034-6748

VL - 69

SP - 2964

EP - 2973

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 8

ER -

A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

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All Science Journal Classification (ASJC) codes

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