Abstract
Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.
Original language | English (US) |
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Pages (from-to) | 2964-2973 |
Number of pages | 10 |
Journal | Review of Scientific Instruments |
Volume | 69 |
Issue number | 8 |
DOIs | |
State | Published - 1998 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Instrumentation