A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

T. Warwick, K. Franck, J. B. Kortright, G. Meigs, M. Moronne, S. Myneni, E. Rotenberg, S. Seal, W. F. Steele, H. Ade, A. Garcia, S. Cerasari, J. Denlinger, S. Hayakawa, A. P. Hitchcock, T. Tyliszczak, J. Kikuma, E. G. Rightor, H. J. Shin, B. P. Tonner

Research output: Contribution to journalArticle

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Abstract

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.

Original languageEnglish (US)
Pages (from-to)2964-2973
Number of pages10
JournalReview of Scientific Instruments
Volume69
Issue number8
DOIs
StatePublished - 1998

All Science Journal Classification (ASJC) codes

  • Instrumentation

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