A revolutionary x-ray tool for true sourceless density logging with superior performance
- Matthieu Simon
- , Avto Tkabladze
- , Sicco Beekman
- , Timothy Atobatele
- , Marc André De Looz
- , Rahul Grover
- , Farid Hamichi
- , Jacques Jundt
- , Kevin McFarland
- , Justin Mlcak
- , Jani Reijonen
- , Arnaud Revol
- , Ryan Stewart
- , Jonathan Yeboah
- , Yi Zhang
Research output: Contribution to conference › Paper › peer-review
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