A parallel product-convolution approach for representing depth varying point spread functions in 3D widefield microscopy based on principal component analysis

Muthuvel Arigovindan, Joshua Shaevitz, John McGowan, John W. Sedat, David A. Agard

Research output: Contribution to journalArticle

28 Scopus citations

Abstract

We address the problem of computational representation of image formation in 3D widefleld fluorescence microscopy with depth varying spherical aberrations. We first represent 3D depth-dependent point spread functions (PSFs) as a weighted sum of basis functions that are obtained by principal component analysis (PCA) of experimental data. This representation is then used to derive an approximating structure that compactly expresses the depth variant response as a sum of few depth invariant convolutions pre-multiplied by a set of ID depth functions, where the convolving functions are the PCA-derived basis functions. The model offers an efficient and convenient trade-off between complexity and accuracy. For a given number of approximating PSFs, the proposed method results in a much better accuracy than the strata based approximation scheme that is currently used in the literature. In addition to yielding better accuracy, the proposed methods automatically eliminate the noise in the measured PSFs.

Original languageEnglish (US)
Pages (from-to)6461-6476
Number of pages16
JournalOptics Express
Volume18
Issue number7
DOIs
StatePublished - Mar 29 2010

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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