A new method to analyze density fluctuation by microwave reflectometry

Kouji Shinohara; Syun'ichi Shiraiwa; Katsumichi Hoshino; Yukitoshi Miura; Kazuaki Hanada; Hiroshi Toyama

doi:10.1143/JJAP.36.7367

A new method to analyze density fluctuation by microwave reflectometry

Kouji Shinohara
, Syun'ichi Shiraiwa
, Katsumichi Hoshino
, Yukitoshi Miura
, Kazuaki Hanada
, Hiroshi Toyama

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

Abstract

The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

Original language	English (US)
Pages (from-to)	7367-7374
Number of pages	8
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	36
Issue number	12 A
DOIs	https://doi.org/10.1143/JJAP.36.7367
State	Published - Dec 1997
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Engineering
General Physics and Astronomy

Keywords

Complex amplitude
Density fluctuation
Plasma diagnostic
Reflectometer
Scattering

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10.1143/JJAP.36.7367

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title = "A new method to analyze density fluctuation by microwave reflectometry",

abstract = "The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.",

keywords = "Complex amplitude, Density fluctuation, Plasma diagnostic, Reflectometer, Scattering",

author = "Kouji Shinohara and Syun'ichi Shiraiwa and Katsumichi Hoshino and Yukitoshi Miura and Kazuaki Hanada and Hiroshi Toyama",

year = "1997",

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TY - JOUR

T1 - A new method to analyze density fluctuation by microwave reflectometry

AU - Shinohara, Kouji

AU - Shiraiwa, Syun'ichi

AU - Hoshino, Katsumichi

AU - Miura, Yukitoshi

AU - Hanada, Kazuaki

AU - Toyama, Hiroshi

PY - 1997/12

Y1 - 1997/12

N2 - The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

AB - The runaway phase phenomenon is a problem in reflectometry measurements. The change in the phase difference between the reflected wave and the reference one cannot be explained by the movement of the cut-off layer when the runaway phase phenomenon occurs. It is difficult to extract information of the density fluctuation from the data with the runaway phase. We show a model in which the runaway phase phenomenon comes from the wave scattered by the density fluctuations, and describe a new analysis method based on this model. The obtained results on plasma displacement and density fluctuation spectrum are presented.

KW - Complex amplitude

KW - Density fluctuation

KW - Plasma diagnostic

KW - Reflectometer

KW - Scattering

UR - https://www.scopus.com/pages/publications/0031367236

UR - https://www.scopus.com/pages/publications/0031367236#tab=citedBy

U2 - 10.1143/JJAP.36.7367

DO - 10.1143/JJAP.36.7367

M3 - Article

AN - SCOPUS:0031367236

SN - 0021-4922

VL - 36

SP - 7367

EP - 7374

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 12 A

ER -

A new method to analyze density fluctuation by microwave reflectometry

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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