A new method for predicting the lifetime of highly stable amorphous-silicon thin-film transistors from accelerated tests

T. Liu, S. Wagner, James Christopher Sturm

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Fingerprint

Dive into the research topics of 'A new method for predicting the lifetime of highly stable amorphous-silicon thin-film transistors from accelerated tests'. Together they form a unique fingerprint.

Engineering & Materials Science