A Model of Thick Scattering Media using a Series of Random Diffraction Gratings

Yaotian Wang, Jason W. Fleischer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We use layers of random diffraction gratings to model the transmission of light through thick scattering media. It successfully describes the propagation features of shifted correlation (the memory effect) and its exponential decay with angle/thickness.

Original languageEnglish (US)
Title of host publicationApplied Industrial Optics
Subtitle of host publicationSpectroscopy, Imaging and Metrology, AIO 2017
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781943580293
StatePublished - 2017
EventApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017 - San Francisco, United States
Duration: Jun 26 2017Jun 29 2017

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceApplied Industrial Optics: Spectroscopy, Imaging and Metrology, AIO 2017
Country/TerritoryUnited States
CitySan Francisco
Period6/26/176/29/17

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

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