A large-area image sensing and detection system based on embedded thin-film classifiers

Warren Rieutort-Louis, Tiffany Moy, Zhuo Wang, Sigurd Wagner, James Christopher Sturm, Naveen Verma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Large-area electronics (LAE) enables the formation of a large number of sensors capable of spanning dimensions on the order of square meters. An example is X-ray imagers, which have been scaling both in dimension and number of sensors, today reaching millions of pixels. However, processing of the sensor data requires interfacing thousands of signals to CMOS ICs, because implementation of complex functions in LAE has proven unviable due to the low electrical performance and inherent variability of the active devices available, namely amorphous silicon (a-Si) thin-film transistors (TFTs) on glass. Envisioning applications that perform sensing on even greater scales, this work presents an approach whereby high-quality image detection is performed directly in the LAE domain using TFTs. The high variability and number of process defects affecting both the TFTs and sensors are overcome using a machine-learning algorithm known as Adaptive Boosting (AdaBoost) [1] to form an embedded classifier. Through AdaBoost, we show that high-dimensional sensor data can be reduced to a small number of weak-classifier decisions, which can then be combined in the CMOS domain to generate a strong-classifier decision.

Original languageEnglish (US)
Title of host publication2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages292-293
Number of pages2
ISBN (Electronic)9781479962235
DOIs
StatePublished - Mar 17 2015
Event2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers - San Francisco, United States
Duration: Feb 22 2015Feb 26 2015

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume58
ISSN (Print)0193-6530

Other

Other2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
CountryUnited States
CitySan Francisco
Period2/22/152/26/15

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Rieutort-Louis, W., Moy, T., Wang, Z., Wagner, S., Sturm, J. C., & Verma, N. (2015). A large-area image sensing and detection system based on embedded thin-film classifiers. In 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers (pp. 292-293). [7063041] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 58). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2015.7063041