A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

P. M. Nilson; F. Ehrne; C. Mileham; D. Mastrosimone; R. K. Jungquist; C. Taylor; C. R. Stillman; S. T. Ivancic; R. Boni; J. Hassett; D. J. Lonobile; R. W. Kidder; M. J. Shoup; A. A. Solodov; C. Stoeckl; W. Theobald; D. H. Froula; K. W. Hill; L. Gao; M. Bitter; P. Efthimion; D. D. Meyerhofer

doi:10.1063/1.4961076

A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

P. M. Nilson, F. Ehrne, C. Mileham, D. Mastrosimone, R. K. Jungquist, C. Taylor, C. R. Stillman, S. T. Ivancic, R. Boni, J. Hassett, D. J. Lonobile, R. W. Kidder, M. J. Shoup, A. A. Solodov, C. Stoeckl, W. Theobald, D. H. Froula, K. W. Hill, L. Gao, M. BitterP. Efthimion, D. D. Meyerhofer

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Abstract

A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K_α1 line. To demonstrate the performance of the spectrometer under high-power conditions, K_α1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10¹⁸ W/cm². The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

Original language	English (US)
Article number	11D504
Journal	Review of Scientific Instruments
Volume	87
Issue number	11
DOIs	https://doi.org/10.1063/1.4961076
State	Published - Nov 1 2016

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.4961076

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Nilson, P. M., Ehrne, F., Mileham, C., Mastrosimone, D., Jungquist, R. K., Taylor, C., Stillman, C. R., Ivancic, S. T., Boni, R., Hassett, J., Lonobile, D. J., Kidder, R. W., Shoup, M. J., Solodov, A. A., Stoeckl, C., Theobald, W., Froula, D. H., Hill, K. W., Gao, L., ... Meyerhofer, D. D. (2016). A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited). Review of Scientific Instruments, 87(11), Article 11D504. https://doi.org/10.1063/1.4961076

@article{fb09f717421c427686e791bd087469a6,

title = "A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)",

abstract = "A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.",

author = "Nilson, \{P. M.\} and F. Ehrne and C. Mileham and D. Mastrosimone and Jungquist, \{R. K.\} and C. Taylor and Stillman, \{C. R.\} and Ivancic, \{S. T.\} and R. Boni and J. Hassett and Lonobile, \{D. J.\} and Kidder, \{R. W.\} and Shoup, \{M. J.\} and Solodov, \{A. A.\} and C. Stoeckl and W. Theobald and Froula, \{D. H.\} and Hill, \{K. W.\} and L. Gao and M. Bitter and P. Efthimion and Meyerhofer, \{D. D.\}",

note = "Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = nov,

day = "1",

doi = "10.1063/1.4961076",

language = "English (US)",

volume = "87",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

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Nilson, PM, Ehrne, F, Mileham, C, Mastrosimone, D, Jungquist, RK, Taylor, C, Stillman, CR, Ivancic, ST, Boni, R, Hassett, J, Lonobile, DJ, Kidder, RW, Shoup, MJ, Solodov, AA, Stoeckl, C, Theobald, W, Froula, DH, Hill, KW, Gao, L, Bitter, M, Efthimion, P & Meyerhofer, DD 2016, 'A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)', Review of Scientific Instruments, vol. 87, no. 11, 11D504. https://doi.org/10.1063/1.4961076

TY - JOUR

T1 - A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

AU - Nilson, P. M.

AU - Ehrne, F.

AU - Mileham, C.

AU - Mastrosimone, D.

AU - Jungquist, R. K.

AU - Taylor, C.

AU - Stillman, C. R.

AU - Ivancic, S. T.

AU - Boni, R.

AU - Hassett, J.

AU - Lonobile, D. J.

AU - Kidder, R. W.

AU - Shoup, M. J.

AU - Solodov, A. A.

AU - Stoeckl, C.

AU - Theobald, W.

AU - Froula, D. H.

AU - Hill, K. W.

AU - Gao, L.

AU - Bitter, M.

AU - Efthimion, P.

AU - Meyerhofer, D. D.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

AB - A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

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DO - 10.1063/1.4961076

M3 - Article

C2 - 27910626

AN - SCOPUS:84983503484

SN - 0034-6748

VL - 87

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

M1 - 11D504

ER -

A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

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