A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

P. M. Nilson; F. Ehrne; C. Mileham; D. Mastrosimone; R. K. Jungquist; C. Taylor; C. R. Stillman; S. T. Ivancic; R. Boni; J. Hassett; D. J. Lonobile; R. W. Kidder; M. J. Shoup; A. A. Solodov; C. Stoeckl; W. Theobald; D. H. Froula; K. W. Hill; L. Gao; M. Bitter; P. Efthimion; D. D. Meyerhofer

doi:10.1063/1.4961076

A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

P. M. Nilson
, F. Ehrne
, C. Mileham
, D. Mastrosimone
, R. K. Jungquist
, C. Taylor
, C. R. Stillman
, S. T. Ivancic
, R. Boni
, J. Hassett
, D. J. Lonobile
, R. W. Kidder
, M. J. Shoup
, A. A. Solodov
, C. Stoeckl
, W. Theobald
, D. H. Froula
, K. W. Hill
, L. Gao
, M. Bitter

P. Efthimion, D. D. Meyerhofer

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu K_α1 line. To demonstrate the performance of the spectrometer under high-power conditions, K_α1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 10¹⁸ W/cm². The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

Original language	English (US)
Article number	11D504
Journal	Review of Scientific Instruments
Volume	87
Issue number	11
DOIs	https://doi.org/10.1063/1.4961076
State	Published - Nov 1 2016

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.4961076

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Nilson, P. M., Ehrne, F., Mileham, C., Mastrosimone, D., Jungquist, R. K., Taylor, C., Stillman, C. R., Ivancic, S. T., Boni, R., Hassett, J., Lonobile, D. J., Kidder, R. W., Shoup, M. J., Solodov, A. A., Stoeckl, C., Theobald, W., Froula, D. H., Hill, K. W., Gao, L., ... Meyerhofer, D. D. (2016). A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited). Review of Scientific Instruments, 87(11), Article 11D504. https://doi.org/10.1063/1.4961076

@article{fb09f717421c427686e791bd087469a6,

title = "A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)",

abstract = "A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.",

author = "Nilson, \{P. M.\} and F. Ehrne and C. Mileham and D. Mastrosimone and Jungquist, \{R. K.\} and C. Taylor and Stillman, \{C. R.\} and Ivancic, \{S. T.\} and R. Boni and J. Hassett and Lonobile, \{D. J.\} and Kidder, \{R. W.\} and Shoup, \{M. J.\} and Solodov, \{A. A.\} and C. Stoeckl and W. Theobald and Froula, \{D. H.\} and Hill, \{K. W.\} and L. Gao and M. Bitter and P. Efthimion and Meyerhofer, \{D. D.\}",

note = "Publisher Copyright: {\textcopyright} 2016 Author(s).",

year = "2016",

month = nov,

day = "1",

doi = "10.1063/1.4961076",

language = "English (US)",

volume = "87",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

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Nilson, PM, Ehrne, F, Mileham, C, Mastrosimone, D, Jungquist, RK, Taylor, C, Stillman, CR, Ivancic, ST, Boni, R, Hassett, J, Lonobile, DJ, Kidder, RW, Shoup, MJ, Solodov, AA, Stoeckl, C, Theobald, W, Froula, DH, Hill, KW, Gao, L, Bitter, M, Efthimion, P & Meyerhofer, DD 2016, 'A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)', Review of Scientific Instruments, vol. 87, no. 11, 11D504. https://doi.org/10.1063/1.4961076

TY - JOUR

T1 - A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

AU - Nilson, P. M.

AU - Ehrne, F.

AU - Mileham, C.

AU - Mastrosimone, D.

AU - Jungquist, R. K.

AU - Taylor, C.

AU - Stillman, C. R.

AU - Ivancic, S. T.

AU - Boni, R.

AU - Hassett, J.

AU - Lonobile, D. J.

AU - Kidder, R. W.

AU - Shoup, M. J.

AU - Solodov, A. A.

AU - Stoeckl, C.

AU - Theobald, W.

AU - Froula, D. H.

AU - Hill, K. W.

AU - Gao, L.

AU - Bitter, M.

AU - Efthimion, P.

AU - Meyerhofer, D. D.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

AB - A high-resolving-power x-ray spectrometer has been developed for the OMEGA EP Laser System based on a spherically bent Si [220] crystal with a radius of curvature of 330 mm and a Spectral Instruments (SI) 800 Series charge-coupled device. The instrument measures time-integrated x-ray emission spectra in the 7.97- to 8.11-keV range, centered on the Cu Kα1 line. To demonstrate the performance of the spectrometer under high-power conditions, Kα1,2 emission spectra were measured from Cu foils irradiated by the OMEGA EP laser with 100-J, 1-ps pulses at focused intensities above 1018 W/cm2. The ultimate goal is to couple the spectrometer to a picosecond x-ray streak camera and measure temperature-equilibration dynamics inside rapidly heated materials. The plan for these ultrafast streaked x-ray spectroscopy studies is discussed.

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UR - https://www.scopus.com/pages/publications/84983503484#tab=citedBy

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DO - 10.1063/1.4961076

M3 - Article

C2 - 27910626

AN - SCOPUS:84983503484

SN - 0034-6748

VL - 87

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

M1 - 11D504

ER -

A high-resolving-power x-ray spectrometer for the OMEGA EP Laser (invited)

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