A dielectric omnidirectional reflector

Yoel Fink, Joshua N. Winn, Shanhui Fan, Chiping Chen, Jurgen Michel, John D. Joannopoulos, Edwin L. Thomas

Research output: Contribution to journalArticle

1151 Scopus citations

Abstract

A design criterion that permits truly omnidirectional reflectivity for all polarizations of incident light over a wide selectable range of frequencies was used in fabricating an all-dielectric omnidirectional reflector consisting of multilayer films. The reflector was simply constructed as a stack of nine alternating micrometer-thick layers of polystyrene and tellurium and demonstrates omnidirectional reflection over the wavelength range from 10 to 15 micrometers. Because the omnidirectionality criterion is general, it can be used to design omnidirectional reflectors in many frequency ranges of interest. Potential uses depend on the geometry of the system. For example, coating of an enclosure will result in an optical cavity. A hollow tube will produce a low- loss, broadband waveguide, whereas a planar film could be used as an efficient radiative heat barrier or collector in thermoelectric devices.

Original languageEnglish (US)
Pages (from-to)1679-1682
Number of pages4
JournalScience
Volume282
Issue number5394
DOIs
StatePublished - Nov 27 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General

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    Fink, Y., Winn, J. N., Fan, S., Chen, C., Michel, J., Joannopoulos, J. D., & Thomas, E. L. (1998). A dielectric omnidirectional reflector. Science, 282(5394), 1679-1682. https://doi.org/10.1126/science.282.5394.1679