A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits

A. L. Wessels, D. T. Becker, D. A. Bennett, J. D. Gard, J. Hubmayr, N. Jarosik, V. Y. Kotsubo, J. A.B. Mates, J. N. Ullom

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