A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits

  • A. L. Wessels
  • , D. T. Becker
  • , D. A. Bennett
  • , J. D. Gard
  • , J. Hubmayr
  • , N. Jarosik
  • , V. Y. Kotsubo
  • , J. A.B. Mates
  • , J. N. Ullom

Research output: Contribution to journalArticlepeer-review

Abstract

Microwave SQUID multiplexing is a promising technique for multiplexing large arrays of transition edge sensors. A major bottleneck in the development and distribution of microwave SQUID multiplexer chips occurs in the time-intensive design testing and quality assurance stages. To obtain useful RF measurements, these devices must be cooled to temperatures below 500 mK. The need for a more efficient system to screen microwave multiplexer chips has grown as the number of chips requested by collaborators per year reaches into the hundreds. We have therefore assembled a test bed for microwave SQUID circuits, which decreases screening time for four 32-channel chips from 24 h in an adiabatic demagnetization refrigerator to approximately 5 h in a helium dip probe containing a closed cycle 3He sorption refrigerator. We discuss defining characteristics of these microwave circuits and the challenges of establishing an efficient testing setup for them.

Original languageEnglish (US)
Pages (from-to)886-892
Number of pages7
JournalJournal of Low Temperature Physics
Volume193
Issue number5-6
DOIs
StatePublished - Dec 1 2018

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • General Materials Science
  • Condensed Matter Physics

Keywords

  • Microwave multiplexing
  • Screening
  • Transition edge sensor

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