A 300-mK Test Bed for Rapid Characterization of Microwave SQUID Multiplexing Circuits

A. L. Wessels, D. T. Becker, D. A. Bennett, J. D. Gard, J. Hubmayr, N. Jarosik, V. Y. Kotsubo, J. A.B. Mates, J. N. Ullom

Research output: Contribution to journalArticlepeer-review


Microwave SQUID multiplexing is a promising technique for multiplexing large arrays of transition edge sensors. A major bottleneck in the development and distribution of microwave SQUID multiplexer chips occurs in the time-intensive design testing and quality assurance stages. To obtain useful RF measurements, these devices must be cooled to temperatures below 500 mK. The need for a more efficient system to screen microwave multiplexer chips has grown as the number of chips requested by collaborators per year reaches into the hundreds. We have therefore assembled a test bed for microwave SQUID circuits, which decreases screening time for four 32-channel chips from 24 h in an adiabatic demagnetization refrigerator to approximately 5 h in a helium dip probe containing a closed cycle 3He sorption refrigerator. We discuss defining characteristics of these microwave circuits and the challenges of establishing an efficient testing setup for them.

Original languageEnglish (US)
Pages (from-to)886-892
Number of pages7
JournalJournal of Low Temperature Physics
Issue number5-6
StatePublished - Dec 1 2018

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • General Materials Science
  • Condensed Matter Physics


  • Microwave multiplexing
  • Screening
  • Transition edge sensor


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