3D vs. 2D device simulation of FinFET logic gates under PVT variations

Sourindra M. Chaudhuri, Niraj Kumar Jha

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Fingerprint

Dive into the research topics of '3D vs. 2D device simulation of FinFET logic gates under PVT variations'. Together they form a unique fingerprint.

Engineering & Materials Science