Engineering & Materials Science
Application specific integrated circuits
11%
Authentication
6%
Automatic test pattern generation
7%
Biomedical equipment
20%
Built-in self test
13%
Capacitance
11%
Cellular automata
11%
Clocks
12%
Combinatorial circuits
8%
Communication
14%
Computer aided design
10%
Computer hardware
52%
Computer operating systems
8%
Computer systems
6%
Controllers
15%
Coprocessor
6%
Costs
14%
Data storage equipment
24%
Deep neural networks
10%
Defects
5%
Delay circuits
12%
Design for testability
25%
Dynamic random access storage
6%
Electric potential
26%
Electric power utilization
45%
Electron tunneling
5%
Embedded software
29%
Embedded systems
76%
Energy conservation
6%
Energy efficiency
9%
Energy utilization
23%
Error detection
10%
Experiments
8%
Fabrication
6%
Fault detection
7%
Fault tolerance
27%
Field effect transistors
12%
Field programmable gate arrays (FPGA)
13%
FinFET
87%
Finite automata
8%
Flow control
41%
Genetic algorithms
7%
Graphical user interfaces
5%
High level synthesis
47%
Hot Temperature
5%
Integrated circuits
9%
Internet of things
11%
Linux
8%
Logic circuits
46%
Logic design
8%
Logic gates
13%
Logic Synthesis
19%
Machine learning
12%
Macros
7%
Majority logic
9%
Medical problems
7%
Memory architecture
12%
Microprocessor chips
7%
Mobile computing
8%
Monitoring
12%
Multiobjective optimization
7%
Nanoelectronics
5%
Nanotechnology
35%
Nanowires
6%
Network protocols
10%
Network-on-chip
17%
Networks (circuits)
100%
Neural networks
8%
Particle accelerators
8%
Personal digital assistants
7%
Power management
27%
Program processors
12%
Random access storage
5%
Real time systems
14%
Reconfigurable architectures
18%
Resonant tunneling diodes
12%
Routers
13%
Scalability
5%
Scheduling
23%
Scheduling algorithms
14%
Sensors
14%
Sequential circuits
7%
Servers
6%
Side channel attack
6%
Simulators
7%
Software architecture
8%
Specifications
13%
Static random access storage
14%
Switches
10%
System-on-chip
12%
Systems analysis
9%
Telecommunication links
10%
Temperature
10%
Testing
21%
Threshold logic
14%
Threshold voltage
7%
Throughput
8%
Transistors
15%
VLSI circuits
9%
Voltage scaling
32%
Mathematics
Architecture
6%
Built-in Self-test
6%
Design
5%
Design of Algorithms
7%
Distributed Systems
5%
Embedded Systems
6%
Fault
12%
Fault Detection
5%
Fault Tolerance
17%
Fault-tolerant Systems
15%
Multiprocessor Systems
6%
Percent
6%
Synthesis
11%
Test Generation
9%
Ubiquitous Computing
6%
