Photo of James Christopher Sturm
Contact Expert
 

View Scopus Profile

James Christopher Sturm

  • 15839 Citations
  • 61 h-Index
1982 …2020

Research output per year

If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where James Christopher Sturm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Projects

Hole-Blocking Layers for Silicon/Organic Heterojunctions: A New Class of High-Efficiency Low-Cost PV

Sturm, J. C.

DOE- Golden Field Office

9/1/11 → 8/31/16

Project: Research project

    • Research Output

    An: In vitro tumor swamp model of heterogeneous cellular and chemotherapeutic landscapes

    Lin, K. C., Sun, Y., Torga, G., Sherpa, P., Zhao, Y., Qu, J., Amend, S. R., Pienta, K. J., Sturm, J. C. & Austin, R. H., Jul 21 2020, In : Lab on a Chip. 20, 14, p. 2453-2464 12 p.

    Research output: Contribution to journal › Article

    • Large-area resistive strain sensing sheet for structural health monitoring

    Aygun, L. E., Kumar, V., Weaver, C., Gerber, M., Wagner, S., Verma, N., Glisic, B. & Sturm, J. C., Mar 1 2020, In : Sensors (Switzerland). 20, 5, 1386.

    Research output: Contribution to journal › Article

    Open Access
    • 3 Scopus citations

    17.3 Hybrid System for Efficient LAE-CMOS Interfacing in Large-Scale Tactile-Sensing Skins via TFT-Based Compressed Sensing

    Aygun, L. E., Kumar, P., Zheng, Z., Chen, T. S., Wagner, S., Sturm, J. C. & Verma, N., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 280-282 3 p. 8662442. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • A Large-Area RFID Reader Array Using Large-Area Electronics

    Mehlman, J. Y., Kumar, P., Verma, N. & Sturm, J., Mar 25 2019

    Research output: Innovation

    • Analyzing and Increasing Yield of ZnO Thin-Film Transistors for Large-area Sensing Systems by Preventing Process-Induced Gate Dielectric Breakdown

    Zheng, Z., Aygun, L. E., Mehlman, Y., Wagner, S., Verma, N. & Sturm, J. C., Jun 2019, 2019 Device Research Conference, DRC 2019. Institute of Electrical and Electronics Engineers Inc., p. 141-142 2 p. 9046406. (Device Research Conference - Conference Digest, DRC; vol. 2019-June).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution